Rio de Janeiro, July 13-14, 2011

About this symposium


For all companies worldwide, the quest for high quality products and services has clearly become a key point for business competitiveness. Among the numerous approaches used for improving the quality, the Statistical Process Control (SPC) plays a particularly important role.

All around the world, there are many researchers who are developing new SPC methods, trying to implement them into real industrial situations and publishing the results into international peer-refereed journals. But, surprisingly, for these researchers, there were no periodic meetings dedicated to this topic only.

Based on this finding, the International Symposium on Statistical Process Control - ISSPC'2009 was held at Nantes, France, in July 2009 (http://isspc2009.free.fr). At the closing session, the participants decided to make it biennial and the ISSPC'2011 will be held in Rio de Janeiro, Brazil.


AIMS

The main objective of this symposium is to bring together a reduced number of selected researchers in SPC and let them present and share their current works. The second related objective is to strengthen existing collaborations and to foster new ones.


Topics

All SPC related topics are of interest and in particular:

 
  • SPC schemes (control charts, adaptive control charts, bayesian control charts, etc.)
    • Control chart design and optimization (economic design of control charts, etc…)
    • Multivariate SPC
    • SPC for autocorrelated processes
    • SPC for special types of processes (multi-stream processes, multi-stage processes, short production runs, batch processes, etc.)
    • Profile monitoring
    • SPC applications (industrial, medical, services, customer satisfaction evaluation, etc, ...),
    • Capability analysis, capability indices

Scientific commitee

 

  • Philippe CASTAGLIOLA, Université de Nantes & IRCCyN UMR CNRS 6597, Nantes, France
  • Antonio F. B. COSTA, Universidade Estadual Paulista, Guaratinguetá, Brazil
  • Maysa DE MAGALHÃES, Instituto Brasileiro de Geografia e Estatística, Rio de Janeiro, Brazil
  • Eugenio K. EPPRECHT, PUC-Rio, Rio de Janeiro, Brazil
  • William H. WOODALL, Virginia Tech, Blacksburg, USA

 

Organizing commitee

  • Eugenio K. EPPRECHT, PUC-Rio, Rio de Janeiro, Brazil
  • Maysa DE MAGALHÃES, Instituto Brasileiro de Geografia e Estatística, Rio de Janeiro, Brazil